Microscopy Tutorial II

Sunday, November 12, 2023: 10:20 AM-12:20 PM
105 ABC (Phoenix Convention Center)
Ms. Rose Ring, Thermo Fisher and Mr. Corey Senowitz, Qualcomm Technologies Inc.
10:20 AM
TEM Techniques for Semiconductor Failure Analysis
Dr. Sam Subramanian, NXP Semiconductors; Mr. Jacob Levenson, NXP Semiconductors
11:20 AM
In-situ Correlative AFM-SEM Characterization for Failure Analysis
Dr. Jan Neuman, NenoVision s. r. o.; Mr. Radek Dao, NenoVision s. r. o.; Mr. Libor Strakos, Thermo Fisher Scientific; Mr. Ondřej Novotný, NenoVision s. r. o.; Mr. Vojtěch Schánilec, NenoVision s. r. o.; Mrs. Veronika Hegrová, NenoVision s. r. o.; Dr. Tomas Vystavel, Thermo Fisher Scientific; Prof. Umberto Celano, Arizona State University
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