Electrons vs. Photons: Assessment of Circuit’s Activity Requirements for E-beam and Optical Probing Attacks

Thursday, November 16, 2023: 2:10 PM
104 A-B (Phoenix Convention Center)
Dr. Elham Amini , TUB Technische Universitaet Berlin, Berlin, Berlin, Germany
Mr. Joerg Jatzkowski , Fraunhofer Institute for Microstructure of Materials and Systems IMWS, Halle, Saxony-Anhalt, Germany
Dr. Tuba Kiyan , TUB Technische Universitaet Berlin, Berlin, Berlin, Germany
Mr. Lars Renkes , TUB Technische Universitaet Berlin, Berlin, Berlin, Germany
Mr. Thilo Krachenfels , TUB Technische Universitaet Berlin, Berlin, Berlin, Germany
Dr. Shahin Tajik , Worcester Polytechnic Institute, worcester, MA
Prof. Christian Boit , TUB Technische Universitaet Berlin, Berlin, Berlin, Germany
Mr. Frank Altmann , Fraunhofer Institute for Microstructure of Materials and Systems IMWS, Halle, Saxony-Anhalt, Germany
Dr. Sebastian Brand , Fraunhofer IMWS, Halle, Germany
Prof. Jean-Pierre Seifert , TUB Technische Universitaet Berlin, Berlin, Berlin, Germany

Summary:

Contactless probing methods through the chip backside have been demonstrated to be powerful attack techniques in the field of electronic security. However, these attacks typically require the adversary to run the circuit under specific conditions, such as enforcing the switching of gates or registers with certain frequencies or repeating measurements over multiple executions to achieve an acceptable signal-to-noise ratio (SNR). Fulfilling such requirements may not always be feasible due to challenges such as low-frequency switching or inaccessibility of the control signals. In this work, we assess these requirements for contactless electron- and photon-based probing attacks by performing extensive experiments. Our findings demonstrate that E-beam probing, in particular, has the potential to outperform optical methods in scenarios involving static or low-frequencycircuit activities.