Technical Program

Saturday, November 11, 2023

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9:00 AM-1:00 PM


Failure Analysis of Electronic Devices

1:00 PM-5:00 PM


Beam Based Defect Localization

5:00 PM-7:00 PM


Registration Open

Sunday, November 12, 2023

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7:00 AM-8:00 AM


Sunday's Author's Coffee

7:00 AM-5:00 PM


Registration Open

10:00 AM-10:20 AM


Sunday's AM Break

12:20 PM-1:30 PM


Sunday's Lunch

3:30 PM-3:50 PM


Sunday's PM Break

Monday, November 13, 2023

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7:00 AM-8:00 AM


Monday's Author's Coffee

7:00 AM-5:00 PM


Registration Open

7:45 AM-10:00 AM


Opening Session and EDFAS General Membership Meeting

10:00 AM-10:20 AM


Monday's AM Refreshment Break

10:20 AM-11:00 AM


Emerging FA Techniques and Concepts
Session Chair: Dr. Baohua Niu and Mr. Kah Chin Cheong

11:10 AM-11:50 AM


FIB Circuit Analysis and Edit
Session Chair: Mr. Antonio Tollis and Mr. Steven Herschbein

Power Devices (Si, SiC, GaN) I
Session Chair: Mr. Helmut Angerer and Dr. Marc Fouchier

11:50 AM-12:50 PM


Monday's Lunch

12:50 PM-1:20 PM


INVITED TALK - Reliability Prediction for Wide Bandgap Power Devices, Professor Joseph Bernstein, Ariel University
Session Chair: Mr. Helmut Angerer and Dr. Marc Fouchier

12:50 PM-2:20 PM


User Group Session | FIB

1:20 PM-2:20 PM


Power Devices (Si, SiC, GaN) II
Session Chair: Mr. Helmut Angerer and Dr. Marc Fouchier

2:20 PM-3:00 PM


Monday's PM Refreshment Break

3:00 PM-4:00 PM


FIB Sample Preparation
Session Chair: Dr. Cathy Vartuli and Ms. Valerie Brogden

Power Devices (Si, SiC, GaN) III

5:00 PM-6:30 PM


TOOLS OF THE TRADE TOUR

7:00 PM-10:00 PM


Social Event at 810 Billiards & Bowling

Tuesday, November 14, 2023

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7:00 AM-8:00 AM


Tuesday's Author's Coffee

7:30 AM-6:30 PM


Registration Open

8:30 AM-9:30 AM


Keynote Session: Wide band gap power devices and related robustness and reliability aspects: Dr. Peter Friedrichs, Vice President SiC Infineon

9:30 AM-10:10 AM


Tuesday's AM Refreshment Break

9:30 AM-6:00 PM


Exhibit Hall Open

Wellness Lounge

10:10 AM-11:30 AM


AI Applications for Failure Analysis
Session Chair: Dr. Yougui Liao and Dr. Sebastian Brand

10:10 AM-11:50 AM


Case Studies and Device Analysis
Session Chair: Mr. Greg Johnson and Dr. Yuyan Wang

11:50 AM-12:50 PM


Tuesday's Lunch

12:50 PM-2:10 PM


Case Studies: FA Process and Workflows I
Session Chair: Dr. Wentao Qin and Dr. Juntao Li

1:50 PM-2:50 PM


User Group Session | AI

2:10 PM-2:50 PM


Packaging and Assembly
Session Chair: Mrs. Sarah Wozny and Mr. Robert Constantin

2:50 PM-3:20 PM


Tuesday's PM Refreshment Break

3:20 PM-3:40 PM


System in Package and 3D Devices
Session Chair: Mr. Joseph Caroselli and Mr. Pradip Sairam Pichumani

3:20 PM-4:40 PM


Case Studies: FA Process and Workflows II
Session Chair: Dr. Wentao Qin and Dr. Juntao Li

3:40 PM-4:40 PM


User Group Session | SIP

4:30 PM-6:00 PM


Welcome Reception with Exhibitors

Wednesday, November 15, 2023

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7:00 AM-8:00 AM


Wednesday's Author's Coffee

7:30 AM-5:30 PM


Registration Open

8:00 AM-9:00 AM


Sample Preparation and Device Deprocessing
Session Chair: Dr. Christopher H. Kang and Ms. Sylvia Lewis

9:00 AM-9:30 AM


Wednesday's AM Refreshment Break

9:00 AM-4:00 PM


Exhibit Hall Open

Wellness Lounge

9:40 AM-10:20 AM


Scanning Probe Analysis
Session Chair: Mr. Phil Kaszuba and Dr. Daminda Dahanayaka

10:20 AM-11:00 AM


Boards and Systems
Session Chair: Ms. Seraina Murphy and Mr. Stephen Fasolino

10:20 AM-12:00 PM


Die Level Fault Isolation
Session Chair: Mr. Dan Bodoh and Ms. Lesly Endrinal

11:00 AM-12:00 PM


User Group Session | Sample Preparation

12:00 PM-1:30 PM


Wednesday's Lunch

Women in Electronics Failure Analysis (WEFA)

1:30 PM-3:00 PM


Charging Forward: Navigating Reliability and Failures in Power Electronics Panel Discussion

3:00 PM-3:15 PM


Winner of the Walking Challenge Announced. Must be present to win! Sponsored by SIEMENS

3:00 PM-4:00 PM


Exhibitor Dessert Reception, Poster Session and Video Contest

Thursday, November 16, 2023

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7:00 AM-8:00 AM


Thursday's Author's Coffee

7:30 AM-1:00 PM


Registration Open

8:00 AM-9:20 AM


Package Level Fault Isolation
Session Chair: Mr. Joseph Caroselli

8:00 AM-10:00 AM


Microscopy Analysis and Materials Characterization
Session Chair: Ms. Rose Ring and Dr. Cecile S. Bonifacio

9:20 AM-10:00 AM


Product Yield, Test, and Diagnostics
Session Chair: Mr. Jayant D'Souza and Dr. Shraddha Bodhe

10:00 AM-10:20 AM


Thursday's AM Refreshment Break

10:20 AM-11:20 AM


User Group Session | Optical Fault Isolation

11:20 AM-11:30 AM


Break

11:30 AM-12:30 PM


User Group Session | Nanoprobing

11:50 AM-12:30 PM


Detecting and Preventing Counterfeit Microelectronics
Session Chair: Mr. Maxwell Hamilton, Ms. Pamela C. Calica and Mr. Kevin Awai

12:30 PM-1:30 PM


Thursday's Lunch

1:30 PM-2:10 PM


Nanoprobing and Electrical Characterization I
Session Chair: Mr. David Albert and Mr. John Sanders

1:30 PM-2:30 PM


Hardware Attacks, Security, and Reverse Engineering I
Session Chair: Mr. Kevin Awai and Dr. Mike Bruce

2:30 PM-2:50 PM


Thursday's PM Refreshment Break

2:50 PM-3:30 PM


Nanoprobing and Electrical Characterization II
Session Chair: Mr. David Albert and Mr. John Sanders

2:50 PM-3:50 PM


Hardware Attacks, Security, and Reverse Engineering II
Session Chair: Mr. Kevin Awai and Dr. Mike Bruce