Lock-in thermography for the localization of security hard blocks on SoC devices

Thursday, November 16, 2023: 2:50 PM
104 A-B (Phoenix Convention Center)
Mr. Michael Koegel , Fraunhofer Institute for Microstructure of Materials and Systems IMWS, Halle, Saxony-Anhalt, Germany
Dr. Sebastian Brand , Fraunhofer Institute for Microstructure of Materials and Systems IMWS, Halle, Saxony-Anhalt, Germany
Mr. Frank Altmann , Fraunhofer Institute for Microstructure of Materials and Systems IMWS, Halle, Saxony-Anhalt, Germany
Mr. Bodo Selmke , Fraunhofer AISEC, Garching, Bavaria, Germany
Mr. Kilian Zinnecker , Fraunhofer AISEC, Garching, Bavaria, Germany
Mr. Robert Hesselbarth , Fraunhofer AISEC, Garching, Bavaria, Germany
Dr. Nisha Jacob Kabakci , Fraunhofer AISEC, Garching, Bavaria, Germany

Summary:

The paper highlights the potential of LIT as a valuable tool for reverse engineering analysis and physical assurance. The authors describe the underlying principles of the technique and present the methodology used to modify the classic lock-in setup for the thermal localization of hard blocks on SoC. The results show that LIT is an effective technique for identifying and localizing security hard blocks on integrated circuits.
See more of: Hardware Attacks, Security, and Reverse Engineering II
See more of: Technical Program