Non-destructive Defect Localization by Scanning Acoustic Microscopy and X-ray Imaging

Sunday, November 12, 2023: 8:00 AM
103 A-B (Phoenix Convention Center)
Dr. Sebastian Brand , Fraunhofer Institute for Microstructure of Materials and Systems IMWS, Halle, Saxony-Anhalt, Germany
Ms. Cheryl Hartfield , Carl Zeiss Microscopy, LLC, Dublin, CA
Dr. Thomas M. Moore , Waviks, Inc., Dallas, TX

See more of: Package and Physical Analysis Challenges Tutorial I
See more of: Tutorial