Mr. Woo Jun Kwon

Product Marketing Manager
Thermo Fisher Scientific
Materials & Structural Analysis
Hillsboro, OR
USA 97124

Papers:

Large area imaging for metrology with high accuracy using Scanning Electron Microscope
Advanced axis correction for automated workflow of Vertical Scanning Electron Microscopy applications
Proposal for tilt-axis adjustment in V-NAND plan-view without Si substrate using automated metrology of Transmission Electron Microscope