49th International Symposium for Testing and Failure Analysis (Nov. 12 – Nov. 16, 2023)
November 12 - 16, 2023
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Dr. Stefano Larentis
Nanoprobe Analyst
NXP Semiconductors
Austin, TX
USA 78735
Papers:
Multilayer pFIB Trenches for Multiple Tip EBAC/EBIRCH Analysis and Internal Node Transistor Characterization
