49th International Symposium for Testing and Failure Analysis (Nov. 12 – Nov. 16, 2023)
November 12 - 16, 2023
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M.Y. Ho
Advanced Micro Devices - Singapore Pte Ltd1
Singapore Singapore 469032
Papers:
In-Situ Orthogonal TEM Lamella Conversion for Catching Subtle Defects in 3D Transistors of Microprocessor Devices
