Mr. Renald Lindayao Dechino

Failure Analysis Engineer
Analog Devices, Inc.
Global Failure Analysis
General Trias, Cavite
Philippines 4107

Papers:

FINITE ELEMENT ANALYSIS (FEA) AND FRACTOGRAPHY: COMPLEMENTARY METHODS IN UNDERSTANDING THE FACTORS RESULTING TO HAIRLINE DIE CRACK ON CHIP-ON-LEAD (COL) DEVICES