FINITE ELEMENT ANALYSIS (FEA) AND FRACTOGRAPHY: COMPLEMENTARY METHODS IN UNDERSTANDING THE FACTORS RESULTING TO HAIRLINE DIE CRACK ON CHIP-ON-LEAD (COL) DEVICES

Tuesday, November 14, 2023: 2:10 PM
103 A-B (Phoenix Convention Center)
Mr. Renald Lindayao Dechino , Analog Devices, Inc., General Trias, Cavite, Philippines
Ms. Melanie S. Cajita , Analog Devices, Inc., General Trias, Cavite, Philippines
Mr. Nico Deus Villafranca , Analog Devices Inc., General Trias, Cavite, Philippines
Mr. Marionne Jose F. Javien , Analog Devices Inc., General Trias, Cavite, Philippines

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