49th International Symposium for Testing and Failure Analysis (Nov. 12 – Nov. 16, 2023)
November 12 - 16, 2023
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Ms. Chinemerem Nwokolo
Product/Test Engineer
NXP Semiconductors
Austin, TX
USA 78749
Papers:
On Demand Bit-Level SRAM Validation using CW 785nm Laser-Induced Fault Analysis (LIFA)
