Microscopy Tutorial I

Sunday, November 12, 2023: 8:00 AM-10:00 AM

105 ABC (Phoenix Convention Center)

Ms. Rose Ring, Thermo Fisher and Mr. Corey Senowitz, Qualcomm Technologies Inc.

8:00 AM

Review of Scanning Probe Microscopy methods for Failure Analysis
Dr. Peter De Wolf, Bruker Nano Surfaces & Metrology

9:00 AM

Sample Preparation for Electron Microscopy Characterization (SEM and TEM) and Failure Analysis of Advanced Semiconductor Devices
Dr. Cecile S. Bonifacio, E.A. Fischione Instruments, Inc.; Dr. Pawel Nowakowski, E.A. Fischione Instruments, Inc.

See more of: Tutorial