Scanning Probe Analysis

Wednesday, November 15, 2023: 9:40 AM-10:20 AM
103 A-B (Phoenix Convention Center)
Mr. Phil Kaszuba, Globalfoundries and Dr. Daminda Dahanayaka, IBM
9:40 AM
Tomography of electrical data in advanced-node SRAMs
Mr. Greg Johnson, ZEISS Microscopy; Dr. Frank Hitzel, DoubleFox GmbH
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