Physics Based Reliability Prediction
Physics Based Reliability Prediction
Thursday, October 31, 2024
Indigo Ballroom (Hilton San Diego Bayfront)
Summary:
We present a method for predicting the failure rate, and thus the reliability of an electronic system by summing the failure rate of each known failure mechanism. We use a competing acceleration factor methodology by combining the physics of failure for each mechanism with their effects as observed by High/Low temperature and High/Low voltage stresses. Our method assumes that lifetime of each of its failure mechanisms follows constant rate distribution and each mechanism is independently accelerated by the stress factors, which include also frequency, current, and other factors that can be entered into a reliability model.
We present a method for predicting the failure rate, and thus the reliability of an electronic system by summing the failure rate of each known failure mechanism. We use a competing acceleration factor methodology by combining the physics of failure for each mechanism with their effects as observed by High/Low temperature and High/Low voltage stresses. Our method assumes that lifetime of each of its failure mechanisms follows constant rate distribution and each mechanism is independently accelerated by the stress factors, which include also frequency, current, and other factors that can be entered into a reliability model.