Application of Advanced Dynamic Photon Emission Microscopy with Programmable Tester for Functional Failure Analysis of DRAM Devices

Thursday, October 31, 2024

Indigo Ballroom (Hilton San Diego Bayfront)

Ms. Hagyeong Kwon , Samsung Electronics, hwaseung-si, Gyeong-gi-do, Korea, Republic of (South)

Ms. Chae Soo Kim , Samsung Electronics, hwaseung-si, Gyeong-gi-do, Korea, Republic of (South)

Ms. Sunah Lee , Samsung Electronics, hwaseung-si, Gyeong-gi-do, Korea, Republic of (South)

Mr. Jihoon Park , Samsung Electronics, hwaseung-si, Gyeong-gi-do, Korea, Republic of (South)

Mr. Jeonghoon Baek , Samsung Electronics, hwaseung-si, Gyeong-gi-do, Korea, Republic of (South)

Mr. Seungchul Yew , Samsung Electronics, hwaseung-si, Gyeong-gi-do, Korea, Republic of (South)

Mr. Dongin Lee , Samsung Electronics, hwaseung-si, Gyeong-gi-do, Korea, Republic of (South)

Mr. Byeongheon Lee , Samsung Electronics, hwaseung-si, Gyeong-gi-do, Korea, Republic of (South)

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