Addressing the Cost and Execution Challenges of Scan Chain Testing and Failure Analysis of complex ICs
Addressing the Cost and Execution Challenges of Scan Chain Testing and Failure Analysis of complex ICs
Wednesday, October 30, 2024: 1:40 PM
202 (Hilton San Diego Bayfront)
Summary:
This paper provides a blueprint for FA laboratories to enable Scan Chain Testing and interfacing to fault isolation tools without a significant additional cost.
This paper provides a blueprint for FA laboratories to enable Scan Chain Testing and interfacing to fault isolation tools without a significant additional cost.