Product Yield, Test and Diagnostics

Wednesday, October 30, 2024: 1:40 PM-2:00 PM
202 (Hilton San Diego Bayfront)
Mr. Jayant D'Souza, Siemens and Mr. Saidapet Ramesh, NXP Semiconductors
1:40 PM
Addressing the Cost and Execution Challenges of Scan Chain Testing and Failure Analysis of complex ICs
Mr. Alexander Flor, Semtech Corporation; Mr. Jeffrey S. Javier, Semtech Corporation
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