Enhanced TEM specimen preparation for STEM-EBIC analysis using a Ga FIB system followed by post-FIB Ar ion beam milling

Wednesday, October 30, 2024: 11:00 AM

204 (Hilton San Diego Bayfront)

Dr. Cecile Bonifacio , E.A. Fischione Instruments, Inc., Export, PA

Dr. William Hubbard, PhD , NanoElectronic Imaging, Inc., Riverside, CA

Dr. Richard Wei-Chih Li , E.A. Fischione Instruments, Inc., Export, PA

Ms. Mary Ray , E.A. Fischione Instruments, Inc., Export, PA

Mr. Paul Fischione , E.A. Fischione Instruments, Inc., Export, PA