Innovative Sample Preparation for Nano-Probing at Pixel Level in 3D BSI Imaging Products

Tuesday, October 29, 2024: 3:40 PM
204 (Hilton San Diego Bayfront)
Mrs. SOPHIE MARTIN, SM , ST Microelectronics, Crolles, Isère, France

See more of: Sample Preparation and Device De-processing
See more of: Technical Program