Emerging FA Techniques and Concepts II
Tuesday, October 29, 2024: 3:00 PM-4:20 PM
202 (Hilton San Diego Bayfront)
Mr. Kent Erington, Advanced Micro Devices and Dr. Mike Bruce, Independant
3:20 PM
CMOS Integrated Circuit Analysis using Superconducting Nanowire Single-Photon Detectors
Mr. Ravin A. Chowdhury, National Institute of Standards and Technology (NIST);
Dr. Jeff Chiles, National Institute of Standards and Technology (NIST);
Mr. Brandon Cage, National Institute of Standards and Technology (NIST);
Dr. Saeed Khan, National Institute of Standards and Technology (NIST);
Dr. Richard P. Mirin, National Institute of Standards and Technology (NIST);
Mr. Ryan O'Loughlin, National Institute of Standards and Technology (NIST);
Dr. Martin J. Stevens, National Institute of Standards and Technology (NIST);
Dr. Jeffrey M. Shainline, National Institute of Standards and Technology (NIST)
3:40 PM
Localization of Subtle Front-End FinFET Defects Using EBIC
Mr. Nick Pronin, NXP Semiconductors;
Mrs. Khiem Ly, NXP Semiconductors;
Mr. Tony Chrastecky, NXP Semiconductors;
Mr. Jacob Levenson, NXP Semiconductors;
Mr. Eric Yi, NXP Semiconductors;
Mr. Kristofor Dickson, NXP Semiconductors;
Dr. Sam Subramanian, NXP Semiconductors;
Dr. Keith Serrels, NXP Semiconductors
4:00 PM
E-beam Probing and E-beam-Assisted Device Alteration (EADA) for Fault Isolation in PowerVia and Advanced Technology Nodes
Mrs. Jennifer Huening, Intel Corporation;
Dr. Tom X. Tong, Intel Corporation;
Mr. Shuai Zhao, Intel Corporation;
Mr. Ravishankar thirugnanasambandam, Intel Corporation;
Dr. Yunfei Wang, Intel Corporation;
Dr. Hyuk Ju Ryu, Intel Corporation;
Dr. Prasoon Joshi, Intel Corporation;
Dr. Mitchell J. Senger, Intel Corporation;
Ms. May Ling Oh, Intel Corporation;
Dr. Renliang Yuan, Intel Corporation;
Mr. Jacob Waelder, Intel Corporation;
Mr. Anil matte, Intel Corporation;
Dr. Baohua Niu, Intel Corporation;
Dr. Zhiyong Ma, Intel Corporation;
Mr. Neel Leslie, Thermo Fisher Scientific;
Dr. James S. Vickers, Thermo Fisher Scientific
