A Correlative Microscopic Workflow Powered by Artificial Intelligence to Accelerate Failure Analysis of Next-Generation Semiconductor Packages

Wednesday, October 30, 2024: 11:00 AM
202 (Hilton San Diego Bayfront)
Dr. Allen Gu , Zeiss Microscopy; Carl Zeiss Microscopy, Dublin, CA, Zeiss Microscopy; Carl Zeiss Microscopy, Dublin, CA

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