Scanning Capacitance Microscopy Application for top-down sample failure analysis on SOI and Bulk Si wafer

Wednesday, October 30, 2024: 3:40 PM
202 (Hilton San Diego Bayfront)
Ms. ZIN NWE TUN , Globalfoundries, Malta, NY
Mr. Ryan Sweeney , Globalfoundries, Malta, NY
Mr. Kevin Davidson , Globalfoundries, Malta, NY
Ms. Esther P.Y. Chen , Globalfoundries, Malta, NY

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