Lock-in Amplifier Applications for Fault Isolation
Lock-in Amplifier Applications for Fault Isolation
Thursday, October 31, 2024: 8:20 AM
204 (Hilton San Diego Bayfront)
Summary:
Lock-in amplifiers and their applications have been introduced as emerging fault isolation techniques for many years that enable the detection of very weak signals buried in noise. Phase detection capability introduced Phase Laser Voltage Imaging (LVI) in addition to Amplitude LVI and the Boxcar Averager option was applied to Laser Voltage Tracing (LVT). Especially LVT become a game changer that enables mapping images from nonperiodic signals that overcomes the intrinsic limitation of LVI with spectrum analyzers or lock-in amplifiers. In this paper, we introduce how LVT plays a key role in compressed scan function analysis and how it helps subsequential Laser Voltage Probing (LVP) set the best probing locations and understand the circuit. Also, we will present a case study of a lock-in amplifier being used for Laser Stimulation analysis diagnosing a PLL unlock failure within a test pattern lacking a pass/fail compare pin.
Lock-in amplifiers and their applications have been introduced as emerging fault isolation techniques for many years that enable the detection of very weak signals buried in noise. Phase detection capability introduced Phase Laser Voltage Imaging (LVI) in addition to Amplitude LVI and the Boxcar Averager option was applied to Laser Voltage Tracing (LVT). Especially LVT become a game changer that enables mapping images from nonperiodic signals that overcomes the intrinsic limitation of LVI with spectrum analyzers or lock-in amplifiers. In this paper, we introduce how LVT plays a key role in compressed scan function analysis and how it helps subsequential Laser Voltage Probing (LVP) set the best probing locations and understand the circuit. Also, we will present a case study of a lock-in amplifier being used for Laser Stimulation analysis diagnosing a PLL unlock failure within a test pattern lacking a pass/fail compare pin.