Case Studies: Device Analysis
Thursday, October 31, 2024: 8:00 AM-9:00 AM
204 (Hilton San Diego Bayfront)
Mr. Greg johnson, Zeiss Microscopy and Dr. Yuyan Wang, Texas Instruments
8:00 AM
Effective FA Approach in Uncovering Gate-to-D/S Tungsten Spur Fabrication Defect
Ms. Alex Marionne Del Castillo, Analog Devices General Trias (ADGT);
Mr. Raymond G. Mendaros, Analog Devices General Trias (ADGT);
Mr. Robin Evangelista, Analog Devices General Trias (ADGT);
Mr. Jae Saladar, Analog Devices General Trias (ADGT);
Mr. Alfred Jay Rafael, Analog Devices General Trias (ADGT);
Ms. Jolina May Matibag, Analog Devices General Trias (ADGT)
8:40 AM
Polysilicon line damage and Burn-in effectiveness in a 0.18um mixed signal product
Dr. Jean-Philippe Manceau, AMS-OSRAM;
Mr. Dann Evasco, AMS-OSRAM;
Mr. Patrick Krenn, AMS-OSRAM;
Mrs. Isabella Hofer, AMS-OSRAM;
Mrs. Monica Giardi, ScioSense;
Mr. Thomas Jost, AMS-OSRAM;
Mr. Josef Ehgartner, AMS-OSRAM;
Mr. Bastian Friesenbicher, AMS-OSRAM;
Mr. Noel Lastima, AMS-OSRAM;
Mr. Klaus Peter Tschernay, AMS-OSRAM
