AFM-in-SEM for precise endpoint delayering

Wednesday, October 30, 2024: 3:00 PM
202 (Hilton San Diego Bayfront)
Dr. Frank Hitzel , DoubleFox GmbH, Braunschweig, NY, Germany
Mr. Greg Johnson , Zeiss Microscopy, Poughkeepsie, NY

Summary:

A survey of AFM-in-SEM tomography of SRAMs is presented. A careful cut through an internal node of an SRAM, with and endpoint signal of electrical data, is presented.
See more of: Scanning Probe Analysis
See more of: Technical Program