Dr. Frank Altmann

Team Leader
Fraunhofer Institute for Microstructure of Materials and Systems IMWS
Center for Applied Microstructure Diagnostics (CAM)
Halle Germany 06120

Papers:

Machine Learning in Semiconductor Failure Analysis: Techniques and Case Studies

Exploring the effectiveness of combining Electron-Beam Probing and Optical Techniques in a 16nm technology device

Failure analysis of InGaAs/GaAs nano-ridge lasers by electron beam based nanoprobing