Dr. Jiaqi Tang

CTO
JIACO Instruments
Delft Netherlands 2628CT

Papers:

Optimizations and Case Studies: Decapsulation of Hardened Epoxy SiC MOSFETs and Diodes via JIACO Microwave Induced Plasma Etching
Advanced Package Sample Preparation Leveraging Precision CNC-based Milling and Selective Microwave Induced Plasma Etching
Removal of Highly Doped Silicon for Backside Fault Isolation with Fluorine-Based Etches
Etched Away