Mr. Kristofor Dickson

NXP Semiconductors
Product Diagnostic Center - Austin
Austin, TX
USA 78735

Papers:

Localization of Subtle Front-End FinFET Defects Using EBIC
Lock-in Amplifier Applications for Fault Isolation
Evaluation of the Analyzability of Complex Secure Intellectual Property using Fault Isolation Techniques versus the Hardware Security Threat They Pose