Mr. Jörg Jatzkowski

FA engineer
Fraunhofer Institute for Microstructure of Materials and Systems IMWS
Center for Applied Microstructure Diagnostics (CAM)
Halle Germany D-06120

Papers:

Exploring the effectiveness of combining Electron-Beam Probing and Optical Techniques in a 16nm technology device

Failure analysis of InGaAs/GaAs nano-ridge lasers by electron beam based nanoprobing