Dr. Lorenz Lechner

Solutions Manager
Kleindiek Inc.
Pleasanton, CA
USA 94588

Papers:

Combining Electrical Fault Isolation and Characterization Inside an SEM to Locate and Characterize Gate Leakages on a 3 nm Device
Consideration of a Ga-FIB in Lamella Sample Prep for EBIC/EBAC Analysis of Advanced-node SRAMs