50th International Symposium for Testing and Failure Analysis (October 28- November 1, 2024)
October 28 - November 1, 2024
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Dr. Richard Li
Scientist
Fischione
Export, PA
USA 15632
Papers:
Enhanced TEM specimen preparation for STEM-EBIC analysis using a Ga FIB system followed by post-FIB Ar ion beam milling
Failure investigation of copper-to-copper bonding in advanced 3D packaging: From sample preparation to structural characterization