50th International Symposium for Testing and Failure Analysis (October 28- November 1, 2024)
October 28 - November 1, 2024
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Dr. Kristof J.P. Jacobs
PhD researcher
imec
Leuven, Vlaams Brabant
Belgium 3001
Papers:
Innovations in Beam-Based Defect Localization Methods for Advanced 3D Interconnects
Failure analysis of InGaAs/GaAs nano-ridge lasers by electron beam based nanoprobing
Application of miniaturized heater for die-level FA using lock-in thermography