Ms. Cheryl Hartfield, MA, FASM

Product marketing manager
ZEISS Microscopy
Plano, TX
USA 75094

Papers:

Fundamentals and Emerging Capabilities of 3D X-ray Microscopy for Semiconductor Advanced Package Failure Analysis
Fundamental Considerations in the Justification, Design & Construction of an Analytical Laboratory for High Tech Imaging & Processing Tools
Consideration of a Ga-FIB in Lamella Sample Prep for EBIC/EBAC Analysis of Advanced-node SRAMs