OFI/Test/Diagnosis User Group Discussion
OFI/Test/Diagnosis User Group Discussion
Wednesday, October 30, 2024: 10:00 AM-11:20 AM
The Pointe (Hilton San Diego Bayfront)
Moderators:Dan Bockelman, Intel Corporation
Dan Bodoh, NXP Semiconductors
Kevin Distelhurst, Globalfoundries
The Optical Fault Isolation, Test, and Diagnosis User Group will include discussions on a variety of topics related to optical probing techniques for fault isolation as well as test and diagnosis.
The format will be open discussion with mini presentations on predetermined topics with opportunities for audience participation.
Examples of discussion topics include:
- Single Photon Detector PICA
- Diagnosis and FA analysis software
- Laser-based techniques
- Lock-in Thermography
- Backside E-beam probing
- FI for Backside Power Delivery
- Quantum Diamond Microscopy
See more of: Technical Program