FA Roadmap Keynote: Marla Dowell, Director of CHIPS Metrology Program and NIST Boulder Laboratory
FA Technology Roadmap Keynote Speaker
Marla Dowell, Director of CHIPS Metrology Program and NIST Boulder Laboratory
"The CHIPS Metrology Program"
The CHIPS and Science Act (CHIPS Act) provides the Department of Commerce (DOC) with $50 billion for a suite of programs to strengthen and revitalize the U.S. position in semiconductor research, development, and manufacturing. Of this $50 billion, the CHIPS Research and Development (R&D) Office, is investing $11 billion across four programs. The purpose of these CHIPS R&D programs is to advance the development of semiconductor technologies and to enhance the competitiveness of the U.S. semiconductor industry: (1) the CHIPS Metrology Program, (2) the CHIPS National Semiconductor Technology Center (NSTC) Program, (3) the CHIPS National Advanced Packaging Manufacturing Program (NAPMP), and (4) the CHIPS Manufacturing USA Program.
The CHIPS Metrology Program is foundational to all CHIPS R&D efforts and emphasizes measurements that are accurate, precise, and fit-for-purpose for the production of microelectronic materials, devices, circuits, and systems. The program leverages NIST’s proven measurement science expertise to address the highest priority metrology challenges identified across industry, academia, and government agencies. NIST will expand upon its strong track record of supporting the semiconductor technology and manufacturing ecosystem by developing, advancing, and deploying standards, reference materials, best practices, and measurement methods. This presentation will give insights into CHIPS funded metrology projects and their contribution to failure analysis and reliability.
Biography:
Marla Dowell is the Director of the CHIPS R&D Metrology Program and NIST Boulder Laboratory. She began her career at NIST as a researcher in the field of optical metrology for photolithography. Dowell has represented NIST on national and international standards committees as well as external advisory committees on research innovation, photonics, and communications. Her abilities to foster collaborations with both private and public sector partners and to lead high performing research organizations have been recognized with numerous awards, including the Allen V. Astin Award and the Arthur S. Flemming Award from George Washington University. Dowell is a fellow of SPIE, senior member of IEEE, and a member of the Federal Innovation Council.