Focused Ion Beam User Group Discussion
Valerie Brogden, University of Oregon
Steven Herschbein, Independent Consultant
Edward Principe, Synchrotron Research
Michael Wong, Thermo Fisher Scientific
Modern FIB (Focused Ion Beam) tools are widely employed across various fab, lab, and failure analysis tasks. These applications include cross-sectioning, high-resolution imaging, sample preparation for other techniques like TEM, and circuit edits. With the introduction of novel ion species, evolving process gases, advanced tool platforms, and an increasing variety of third-party accessories, the scope of FIB applications is continually changing. For many lab managers, the cost of ownership, maintenance, and the available service/support models have raised more questions about the potential for outsourcing. Additionally, the advent of gate-all-around devices introduces new challenges for FIB technology.
This one and half hour ISTFA special event is designed for anyone working with FIB tools, or those with a general interest, to share insights, ask questions, and explore opportunities for future collaboration. This year we will continue with our successful format of mini-presentations, open-floor discussions, and dynamic exchanges of ideas. Bring your questions, challenges, suggestions, and tips to share with the community. Whether you're seeking to learn something new or challenge the status quo, this event is all about open dialogue and shared learning. While the organizers will provide a basic framework to guide the conversation, the event is truly driven by its participants.