AI Applications for Failure Analysis - Advanced Data Imputation Methodology for Handling Missing Values in the Semiconductor Manufacturing Process

Wednesday, November 19, 2025

Ms. Julee Kim , Samsung Electronics, Hwaseong-si, Gyeonggi-do, Korea, Republic of (South)

Mr. Seokyeong Kim , Samsung Electronics, Hwaseong-si, Gyeonggi-do, Korea, Republic of (South)

Mr. Soojae Heo , Samsung Electronics, Hwaseong-si, Gyeonggi-do, Korea, Republic of (South)

Mr. Hyoungjun Kim , Samsung Electronics, Hwaseong-si, Gyeonggi-do, Korea, Republic of (South)

Mr. Junghwan Lee , Samsung Electronics, Hwaseong-si, Gyeonggi-do, Korea, Republic of (South)

See more of: Poster Session
See more of: Poster Session