FA Process: Fault Isolation, Mechanisms, & Solutions - Stress-Optimized Screening for Reliability-Critical BCAT Disconnections in Advanced DRAM

Summary:

With continued DRAM scaling, BCAT disconnections have emerged as critical reliability risks. Conventional stress tests using long WL activation are time-consuming and degrade samples. This work proposes a faster, voltage- and timing-optimized screening method that enhances defect detection without sacrificing accuracy.