Accelerated Prediction and Spatial Profiling of HEIP Degradation for Layout-Driven Reliability Analysis
Wednesday, November 19, 2025
Ms. Gyulyeong Nor
,
Samsung Electronics, Hwaseong-si, Gyeonggi-do, Korea, Republic of (South)
Mr. Jongwon Nam
,
Samsung Electronics, Hwaseong-si, Gyeonggi-do, Korea, Republic of (South)
Mr. Yumin Kim
,
Samsung Electronics, Hwasung-City, Korea, Republic of (South)
Mr. Ilwoo Jung
,
Samsung Electronics, Hwaseong, Gyeonggi-do, Korea, Republic of (South)
Mr. Dongin Lee
,
Samsung Electronics, hwaseung-si, Gyeong-gi-do, Korea, Republic of (South)
