Ultra-high speed/High timing-resolution Electro-optic probing using streak camera
Ultra-high speed/High timing-resolution Electro-optic probing using streak camera
Thursday, November 20, 2025: 9:20 AM
1 (Pasadena Convention Center)
Summary:
Electro-optic (EO) probing is a widely used technique in failure analysis (FA). Conventional EO probing techniques use digitizers or oscilloscopes to accumulate data over extended periods to obtain waveforms, making the EO probing method a time-consuming technique for FA. This paper presents a novel approach to using a streak camera in conjunction with Automated Test Equipment (ATE). By adjusting the high reputation test loop over 1 MHz, one can capture the waveform in a short temporal acquisition window with extremely high time resolution.
Electro-optic (EO) probing is a widely used technique in failure analysis (FA). Conventional EO probing techniques use digitizers or oscilloscopes to accumulate data over extended periods to obtain waveforms, making the EO probing method a time-consuming technique for FA. This paper presents a novel approach to using a streak camera in conjunction with Automated Test Equipment (ATE). By adjusting the high reputation test loop over 1 MHz, one can capture the waveform in a short temporal acquisition window with extremely high time resolution.