Technical Program

Monday, November 17, 2025

Monday | Tuesday | Wednesday | Thursday | top

7:45 AM-10:00 AM


Opening Session - Best Paper, ESREF, IPFA Update & EDFAS General Meeting

10:20 AM-11:00 AM


Emerging FA Techniques and Concepts I
Session Chair: Mr. Kent Erington and Dr. Mike Bruce

10:20 AM-11:20 AM


FIB Sample Preparation I
Session Chair: Dr. Cathy Vartuli and Ms. Valerie Brogden

Package Level Fault Isolation
Session Chair: Sylvia Lewis and Ms. Susan Li

11:30 AM-12:10 PM


Emerging FA Techniques and Concepts II

FIB Sample Preparation II

Scanning Probe Analysis
Session Chair: Mr. Phil Kaszuba and Mr. Daminda Dahanayaka

12:10 PM-1:40 PM


FIB User Group Discussion & Lunch

Nanoprobing / SPM User Group Discussion & Lunch

1:40 PM-2:40 PM


FIB Sample Preparation III

Microscopy Analysis and Material Characterization I
Session Chair: Dr. Cecile S. Bonifacio and Prof. Rosine COQ GERMANICUS

3:00 PM-4:00 PM


FIB Sample Preparation IV

Microscopy Analysis and Material Characterization II

4:00 PM-4:40 PM


FIB Circuit Analysis & Edit
Session Chair: Mr. Antonio Tollis and Mr. Steven Herschbein

4:00 PM-5:00 PM


Product Yield, Test and Diagnostics
Session Chair: Jayant D'Souza and Dr. Venkat Ravikumar

Tuesday, November 18, 2025

Monday | Tuesday | Wednesday | Thursday | top

8:30 AM-9:30 AM


ISTFA Keynote Speaker: Dr. Raja Swaminathan, Corporate Vice President of Heterogenous Integration Technologies, AMD

10:00 AM-10:30 AM


Chips Act Update

10:30 AM-11:50 AM


AI Applications for Failure Analysis I
Session Chair: Dr. Sebastian Brand and Zachary Eich

Device Analysis - Case Studies I
Session Chair: Mr. Greg Johnson and Dr. Yuyan Wang

FA Process: Fault Isolation, Mechanisms, & Solutions I
Session Chair: Mr. Kah Chin Cheong and Vinod Narang

12:50 PM-1:30 PM


FA Process: Fault Isolation, Mechanisms, & Solutions II

12:50 PM-2:10 PM


Device Analysis - Case Studies II

12:50 PM-2:50 PM


AI Applications for Failure Analysis II

1:30 PM-2:30 PM


Nanoprobing & Electrical Characterization I
Session Chair: David Albert and Mr. John Sanders

2:10 PM-2:30 PM


The Capital Equipment Buying Journey in FA Labs

3:20 PM-4:20 PM


Nanoprobing & Electrical Characterization II

3:20 PM-4:50 PM


AI User Group Discussion

Wednesday, November 19, 2025

Monday | Tuesday | Wednesday | Thursday | top

8:00 AM-9:00 AM


Power Devices (Si, SiC, GaN)
Session Chair: Dr. Chris Kang and Baohua Niu

9:00 AM-10:30 AM


SIP User Group Discussion

10:30 AM-11:30 AM


IRFA Keynote Speaker - Dr. Shida Tan

11:50 AM-1:20 PM


Women in Failure Analysis Session & Lunch

1:30 PM-3:00 PM


Panel Discussion

3:00 PM-4:00 PM


Expo Floor - Poster Session

Thursday, November 20, 2025

Monday | Tuesday | Wednesday | Thursday | top

8:00 AM-8:40 AM


Boards and System Level FA
Session Chair: Mr. Stephen Fasolino and Ms. Bernice Zee

More Than Moore: Si-Photonics, Magnetics, Magneto-Optics, Biosensors, Quantum Computing, 2D Materials, SQUID etc.
Session Chair: Dr. Ricky Anthony and Dr. William Lo

8:40 AM-9:40 AM


Die Level Fault Isolation I
Session Chair: Ms. Lesly Endrinal and Mr. Dan Bodoh

10:00 AM-11:00 AM


Die Level Fault Isolation II

Sample Preparation and Device De-processing I
Session Chair: Ms. Rose Ring and Dr. Zachary Lingley

11:20 AM-12:50 PM


OFI User Group Discussion & Lunch

Sample Prep User Group Discussion & Lunch

12:50 PM-1:30 PM


Sample Preparation and Device De-processing II

12:50 PM-2:10 PM


Hardware Security and Counterfeiting
Session Chair: Mr. Kevin Awai and Ms. Pamela Calica

1:30 PM-2:10 PM


System in Package and 3D Devices
Session Chair: Mr. Neel Leslie and Kevin Distelhurst