51st International Symposium for Testing and Failure Analysis (November 16-20, 2025)
November 16 - 20, 2025
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Basics and Current Aspects of Scanning Electron Microscopy
Sunday, November 16, 2025: 10:20 AM
3 (Pasadena Convention Center)
Dr. Heiko Stegmann
,
Carl Zeiss Microscopy GmbH, Oberkochen, Germany
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Microscopy - SEM Basics
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Tutorial