51st International Symposium for Testing and Failure Analysis (November 16-20, 2025)
November 16 - 20, 2025
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Sunday, November 16, 2025
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8:00 AM-9:00 AM
Microscopy - TEM
Package and Physical Analysis - Flip Chip
Tech. Specific & Featured - Machine Learning
9:00 AM-10:00 AM
Microscopy - TEM Sample Prep
Package and Physical Analysis - Chip Scale
Session Chair: Dr. Cecile S. Bonifacio and Ms. Melissa Mullen
Tech. Specific & Featured - SRAM
10:20 AM-11:20 AM
Fault Isolation - CSAM I
Microscopy - SEM Basics
Tech. Specific & Featured - Lab Construction
11:20 AM-12:20 PM
Fault Isolation - Lock-in Thermography
Microscopy - TEM Imag w/SEM Diffraction
Tech. Specific & Featured - Intro to FIB
1:30 PM-2:30 PM
Electrical & Yield - Nanoprobe
Fault Isolation - CSAM II
Microscopy - SEM Sample Prep
2:30 PM-3:30 PM
Electrical & Yield - MOSFET Testing
Microscopy - FIB Sample Prep
Tech. Specific & Featured - Analog Sim
Session Chair: Jason Holm, PhD and Dr. William Hubbard, PhD
3:50 PM-4:50 PM
Electrical & Yield - Yield Basics
Session Chair: Mr. Greg Johnson, STEFANIE BOURBON and Dr. Bryan Tracy, PhD
Microscopy - AFM in SEM
3:50 PM-5:20 PM
Fault Isolation - LADA/SDL
Monday, November 17, 2025
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3:00 PM-4:30 PM
Fault Isolation - Diag SoC
Session Chair: Dr. Michael Bruce
Tuesday, November 18, 2025
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3:20 PM-4:20 PM
Microscopy - Charged Particle
Wednesday, November 19, 2025
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8:00 AM-9:00 AM
Microscopy - Atomic Probe Tomography
Microscopy - STEM EBIC
Thursday, November 20, 2025
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8:40 AM-9:40 AM
Microscopy - Spectrometers
Session Chair: Ms. Rose Ring, Mr. Randy Mulder and Dr. Pawel Nowakowski