51st International Symposium for Testing and Failure Analysis (November 16-20, 2025): Tutorial

Tutorial

Microscopy - TEM
Session Chair: Rosalinda Ring, Dr. Pawel Nowakowski and Mr. Randy Mulder

Package and Physical Analysis - Flip Chip
Session Chair: Dr. Cecile S. Bonifacio and Ms. Melissa Mullen

Tech. Specific & Featured - Machine Learning
Session Chair: Jason Holm, PhD and Dr. William Hubbard, PhD

Microscopy - TEM Sample Prep
Session Chair: Rosalinda Ring, Dr. Pawel Nowakowski and Mr. Randy Mulder

Package and Physical Analysis - Chip Scale
Session Chair: Dr. Cecile S. Bonifacio and Ms. Melissa Mullen

Tech. Specific & Featured - SRAM
Session Chair: Jason Holm, PhD and Dr. William Hubbard, PhD

Fault Isolation - CSAM I
Session Chair: Dr. Mike Bruce

Microscopy - SEM Basics
Session Chair: Rosalinda Ring, Dr. Pawel Nowakowski and Mr. Randy Mulder

Tech. Specific & Featured - Lab Construction
Session Chair: Jason Holm, PhD and Dr. William Hubbard, PhD

Fault Isolation - Lock-in Thermography
Session Chair: Dr. Mike Bruce

Microscopy - TEM Imag w/SEM Diffraction
Session Chair: Rosalinda Ring, Dr. Pawel Nowakowski and Mr. Randy Mulder

Tech. Specific & Featured - Intro to FIB
Session Chair: Jason Holm, PhD and Dr. William Hubbard, PhD

Electrical & Yield - Nanoprobe
Session Chair: Mr. Greg Johnson and Dr. Bryan Tracy, PhD

Fault Isolation - CSAM II
Session Chair: Dr. Mike Bruce

Microscopy - SEM Sample Prep
Session Chair: Rosalinda Ring, Dr. Pawel Nowakowski and Mr. Randy Mulder

Electrical & Yield - MOSFET Testing
Session Chair: Mr. Greg Johnson and Dr. Bryan Tracy, PhD

Microscopy - FIB Sample Prep
Session Chair: Rosalinda Ring, Dr. Pawel Nowakowski and Mr. Randy Mulder

Tech. Specific & Featured - Analog Sim
Session Chair: Jason Holm, PhD and Dr. William Hubbard, PhD

Electrical & Yield - Yield Basics
Session Chair: Mr. Greg Johnson and Dr. Bryan Tracy, PhD

Microscopy - AFM in SEM
Session Chair: Rosalinda Ring, Dr. Pawel Nowakowski and Mr. Randy Mulder

Fault Isolation - LADA/SDL
Session Chair: Dr. Mike Bruce

Fault Isolation - Diag SoC
Session Chair: Dr. Mike Bruce

Microscopy - Charged Particle
Session Chair: Rosalinda Ring, Dr. Pawel Nowakowski and Mr. Randy Mulder

Microscopy - Atomic Probe Tomography
Session Chair: Rosalinda Ring, Dr. Pawel Nowakowski and Mr. Randy Mulder

Microscopy - STEM EBIC
Session Chair: Rosalinda Ring, Dr. Pawel Nowakowski and Mr. Randy Mulder

Microscopy - Spectrometers
Session Chair: Rosalinda Ring, Dr. Pawel Nowakowski and Mr. Randy Mulder