51st International Symposium for Testing and Failure Analysis (November 16-20, 2025)
November 16 - 20, 2025
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Advanced STEM EBIC: Concepts and Applications
Wednesday, November 19, 2025: 8:00 AM
1 (Pasadena Convention Center)
Dr. William Hubbard, PhD
,
NanoElectronic Imaging, Inc., Riverside, CA
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Microscopy - STEM EBIC
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Tutorial