Identification of Counterfeit Integrated Circuits using a Low-Cost Near-Field Microprobe Scanning Setup

Thursday, November 20, 2025: 1:10 PM
1 (Pasadena Convention Center)
Mr. Michael Koegel , Fraunhofer Institute for Microstructure of Materials and Systems IMWS, Halle, Saxony-Anhalt, Germany
Dr. Sebastian Brand , Fraunhofer Institute for Microstructure of Materials and Systems IMWS, Halle, Saxony-Anhalt, Germany
Mr. Sebastian Tismer , Fraunhofer Institute for Microstructure of Materials and Systems IMWS, Halle, Saxony-Anhalt, Germany
Mr. Adrian Juwien , Deutsche Bahn AG, Halle, Saxony-Anhalt, Germany
Mr. Frank Altmann , Fraunhofer Institute for Microstructure of Materials and Systems, Halle, Germany

Summary:

This paper describes a custom, low‑cost, two‑dimensional near‑field‑scanning system that uses self‑built electromagnetic probes and streamlined signal‑processing software to identify relabelled or cloned integrated circuits by their unique emission footprints.
See more of: Hardware Security and Counterfeiting
See more of: Technical Program