Product Yield, Test and Diagnostics - Failure Analysis for Yield Improvement Based on Cell-aware Diagnosis

Wednesday, November 19, 2025
Muyun Cho , Samsung, Giheung-gu, Yongin-si, Gyeonggi, Korea, Republic of (South)
Youngseok Son , Samsung, Giheung-gu, Yongin-si, Gyeonggi, Korea, Republic of (South)
Hyunyul Lim , Samsung, Giheung-gu, Yongin-si, Gyeonggi, Korea, Republic of (South)
Jaeseok Park , Samsung, Giheung-gu, Yongin-si, Gyeonggi, Korea, Republic of (South)
Eunkyung Kang , Synopsys Inc, Seongnam, Gyeonggi, Korea, Republic of (South)
Changseon Chae , Synopsys Inc, Seongnam, Gyeonggi, Korea, Republic of (South)
Dr. Ruifeng Guo , Synopsys, Hillsboro, OR

See more of: Poster Session
See more of: Poster Session