51st International Symposium for Testing and Failure Analysis (November 16-20, 2025)
November 16 - 20, 2025
Menu
Home
Start
Browse
Browse by Day
At-A-Glance
Author Index
Mr. Wolfgang Joachimi
CTO
point electronic GmbH
Halle Germany 06120
Papers:
Scan-mode assisted LockIn RCI and EBIRCH for localization of low resistive defects
