Mr. Shimpei Tominaga

Application engineer
Hamamatsu Photonics K.K.
System Division
Hamamatsu, Shizuoka
Japan 431-3196

Papers:

Die Level Fault Isolation - High Resolution Thermal Imaging of Si Device by Near-Infrared Thermo-Reflectance and Separation of Thermal/Electro-optical Mixed Signals by Means of Bias Dependency