Mr. Arnulfo Evangelista

Analog
World Wide Quality
Wilmington, MA
USA 01887

Papers:

Fault Isolation FA Methodology on Multi-Bonded Device
Die Level Fault Isolation - Failure Defect Modeling and Offset Voltage Calculator to determine the Effect of PMOS Threshold Voltage Shift and Resistance Mismatch of Segmented Digital-to-Analog Converter
Uncovering the True Root Cause: Fabrication Defects Behind EOS-like Failures in GaAs MIM Capacitor Structures