51st International Symposium for Testing and Failure Analysis (November 16-20, 2025): https://www.asminternational.org/istfa-2025/

51st International Symposium for Testing and Failure Analysis (November 16-20, 2025)
November 16 - 20, 2025

  • Home
  • Start
  • Browse
    • Browse by Day
  • At-A-Glance
  • Author Index

Mr. Ryan Ordiales

Design Engineering Manager
Analog Devices Inc
Design
General Trias Philippines 4107

Papers:

Die Level Fault Isolation - Failure Defect Modeling and Offset Voltage Calculator to determine the Effect of PMOS Threshold Voltage Shift and Resistance Mismatch of Segmented Digital-to-Analog Converter

  • Home
  • Start
  • Browse
    • Browse by Day
  • At-A-Glance
  • Author Index
General Information

November 16 - 20, 2025


Pasadena, CA